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EXAMINATION/DIAGNOSIS DEVICE コモンズ

外国特許コード F170008937
掲載日 2017年1月20日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2016JP001819
国際公開番号 WO 2016174819
国際出願日 平成28年3月29日(2016.3.29)
国際公開日 平成28年11月3日(2016.11.3)
優先権データ
  • 特願2015-090299 (2015.4.27) JP
発明の名称 (英語) EXAMINATION/DIAGNOSIS DEVICE コモンズ
発明の概要(英語) The examination/diagnosis device according to the present invention includes a probe, a stress detecting part, and a grip part. The probe has a tall part and a distal-end part, and the distal-end part is provided so as to curve from one end part of the tall part. The stress detecting part is configured so as to be capable of detecting an X-direction force, a Y-direction force, and a Z-direction force applied to the distal-end part of the probe. The distal-end part of the probe may be bent in a plane parallel to the X direction and the Z direction. A user brings the distal-end part of the probe into contact with a joint as a subject of examination and diagnosis while gripping the grip part.
従来技術、競合技術の概要(英語) BACKGROUND ART
As orthopedic surgery, intra-articular treatment of the surrounding tissue and the arthroscopic surgery. In arthroscopic surgery, an arthroscope is inserted into the joint, it was confirmed that the surgical operation while the condition is performed.
In arthroscopic surgery, of tissue damage using a probe can be confirmed (see Non-Patent Document 1 and 2). For example, the target of surgical procedures such as the hip joint the hip joint disease as a representative example, a hip joint disease is osteoarthritis. In recent years, the use of a symptom of osteoarthritis of the hip joint and the edge portion of the hip joint may appear on the lips and while recognized, the cartilage disease and are also found that the fault occurs. Therefore, understand the pathological condition in the hip, articular cartilage or the traction of the probe is used to press the lips and the like are performed, the presence or absence of the lips and cartilage of the joint and the degree of damage is evaluated qualitatively.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • OSAKA SANGYO UNIVERSITY
  • 発明者(英語)
  • HANANOUCHI, Takehito
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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