Top > Search of International Patents > SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT DEVICE

SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT DEVICE meetings

Foreign code F170009238
File No. (S2016-0476-N0)
Posted date Sep 21, 2017
Country WIPO
International application number 2016JP088196
International publication number WO 2017149912
Date of international filing Dec 21, 2016
Date of international publication Sep 8, 2017
Priority data
  • P2016-040061 (Mar 2, 2016) JP
Title SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT DEVICE meetings
Abstract A shape measurement method to which the present invention is applied is provided with: a step for irradiating an object to be measured with a light pulse stream in which a plurality of light pulses having a prescribed frequency distribution with respect to a time axis are disposed in a consecutive sequence in time series; and a step for measuring the optical shape of the object to be measured using the correspondence relationship between the sequence numbers of the light pulses of a plurality of light pulse streams to be received after the emitted light pulses are applied to the object to be measured, and using the correspondence relationship between the frequency distributions in the light pulses.
Outline of related art and contending technology BACKGROUND ART
To be measured by using light (the object to be measured) a method of measuring the shape, the non-contact, destructive and it has excellent properties, industry, medical as well as the expected to be applied to the field of basic science and. Light is used as the shape measurement device, also referred to as a so-called moire method for example, the encoded a method using a pattern of light, such as a method based on the distance calculating part which has been proposed a variety of methods.
For example, to Patent Document 1, a regular color change over the light pulse is generated the chirp and the chirp the optical pulse generation means, the workpiece (object to be measured) the chirped light generating means via the chirp from the combined light, the measurement value acquired two-dimensional information of the reflected light in the reference time based on the color of light to a three-dimensional three-dimensional information acquisition means, a three-dimensional measuring device is disclosed. This three-dimensional measuring apparatus, the light which is generated by the chirp of the chirp pulse is irradiated to an object being measured, obtained via the measuring object light is obtained. By means of the three-dimensional information at the time of the measurement standard the acquired color information of the light, the three-dimensional shape of the measurement object in association with.
As a measurement technique to another shape, for example, to Patent Document 2, light is emitted to the object of the reflected image is captured and the amount of time required to measure the distance to the object is measured using a three-dimensional shape measuring method in (shape measuring method), and encoding a sequence of the light emitted, the encoded light by decoding the reflected image of the three-dimensional shape measurement method for distance measurement is disclosed. In the three-dimensional shape measuring method, light emitted toward the measurement target is, a substantially flat or planar light light is used. In addition, the coding of the order of the light, or wavelength of the light beam can be changed by changing the timing of light is performed.
Scope of claims (In Japanese)[請求項1]
時間軸に対する所定の周波数分布を有する光パルスが時系列に番号順に複数配された光パルス列を被測定物体に照射する工程と、
出射された前記光パルスが前記被測定物体に作用した後の複数の受光対象光パルス列同士の前記光パルスの前記番号の対応関係と、前記光パルス内の前記周波数分布の対応関係とによって前記被測定物体の光学的形状を測定する工程と、
を備えている形状測定方法。
[請求項2]
前記光パルス列は光コムの離散的モード周波数の位相を制御することによって得られる請求項1に記載の形状測定方法。
[請求項3]
前記複数の受光対象光パルス列同士の前記光パルスの前記番号の対応関係は、前記受光対象光パルス列と所定の光路長を有する伝搬空間内を伝搬した参照光パルス列とが干渉することにより発生する干渉信号を用いて得られる請求項1又は請求項2に記載の形状測定方法。
[請求項4]
時間軸に対する所定の周波数分布を有する光パルスが時系列に番号順に複数配された光パルス列を被測定物体に照射する光源と、
前記光源から出射された前記光パルスが前記被測定物体に作用した後の複数の受光対象光パルス列同士の前記光パルスの前記番号の対応関係と、前記光パルス内の前記周波数分布の対応関係とによって前記被測定物体の光学的形状を測定する光学的形状測定部と、
を備えている形状測定装置。
[請求項5]
前記光源は、離散的モード周波数の位相が制御されることによって前記光パルス列を出射可能な光コムを備えている請求項4に記載の形状測定装置。
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • THE UNIVERSITY OF ELECTRO-COMMUNICATIONS
  • Inventor
  • MINOSHIMA Kaoru
IPC(International Patent Classification)
Specified countries National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
Please contact us by E-mail or facsimile if you have any interests on this patent.

PAGE TOP

close
close
close
close
close
close