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REFRACTIVE INDEX MEASUREMENT DEVICE AND REFRACTIVE INDEX MEASUREMENT METHOD

外国特許コード F180009368
整理番号 (S2016-0984-N0)
掲載日 2018年4月19日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2017JP029871
国際公開番号 WO 2018043194
国際出願日 平成29年8月22日(2017.8.22)
国際公開日 平成30年3月8日(2018.3.8)
優先権データ
  • 特願2016-166544 (2016.8.29) JP
発明の名称 (英語) REFRACTIVE INDEX MEASUREMENT DEVICE AND REFRACTIVE INDEX MEASUREMENT METHOD
発明の概要(英語) In the present invention, an LED (3) emits light that includes a plurality of linearly-polarized-light components having different polarization directions. The light from the LED (3) enters one end of a waveguide member (4) having an elongated column shape, is totally reflected by side surfaces (4Aa, 4Ab) of the waveguide member (4) having metallic thin film (4B) that produces surface plasmon resonance partially formed thereon, and is then emitted from the other end. A polarizing plate (6) extracts a linearly-polarized-light component having a specific polarization direction from the light emitted by the waveguide member (4). A selection unit (7) selects the polarization direction of the linearly-polarized-light component extracted by the polarizing plate (6). A light-reception unit (8) detects the intensity of the linearly-polarized-light component of the light extracted by the polarizing plate (6). A measurement unit (10) measures the refractive index of a sample (12) on the basis of the light intensity detected by the light-reception unit (8). The waveguide member (4) has a plurality of planar side surfaces (4Aa, 4Ab) for which one of the plurality of linearly-polarized-light components included in the entering light is p-polarized and that each have different responses to p-polarized light.
従来技術、競合技術の概要(英語) BACKGROUND ART
Surface plasmon resonance (SPR) phenomenon is, the free electrons existing on the metal surface and interact with the light, the refractive index of the medium in contact with the metal corresponding to the light absorption of a portion of the phenomenon. The SPR using a phenomenon in which, the quartz glass rod (an optical fiber core) having a thickness of several tens of nm on the side of the metal thin film is formed, light incident from the end of an optical fiber and measuring the intensity of light emitted from the other end of the can, the metal thin film in contact with measuring the index of refraction of the sample (for example, see Patent Document 1 to 4).
4 Disclosed in Patent Document 1 to the refractive index according to the measuring equipment, using the driving mechanisms to change the incident angles of observation without change in the intensity of the reflected, incident on the core of the optical fiber is emitted only by measuring the intensity of light, the refractive index of the sample can be measured.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KAGOSHIMA UNIVERSITY
  • 発明者(英語)
  • HIGO Morihide
  • MITSUSHIO Masaru
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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