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REFRACTIVE INDEX MEASUREMENT DEVICE AND REFRACTIVE INDEX MEASUREMENT METHOD

外国特許コード F180009368
整理番号 (S2016-0984-N0)
掲載日 2018年4月19日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2017JP029871
国際公開番号 WO 2018043194
国際出願日 平成29年8月22日(2017.8.22)
国際公開日 平成30年3月8日(2018.3.8)
優先権データ
  • 特願2016-166544 (2016.8.29) JP
発明の名称 (英語) REFRACTIVE INDEX MEASUREMENT DEVICE AND REFRACTIVE INDEX MEASUREMENT METHOD
発明の概要(英語) In the present invention, an LED (3) emits light that includes a plurality of linearly-polarized-light components having different polarization directions. The light from the LED (3) enters one end of a waveguide member (4) having an elongated column shape, is totally reflected by side surfaces (4Aa, 4Ab) of the waveguide member (4) having metallic thin film (4B) that produces surface plasmon resonance partially formed thereon, and is then emitted from the other end. A polarizing plate (6) extracts a linearly-polarized-light component having a specific polarization direction from the light emitted by the waveguide member (4). A selection unit (7) selects the polarization direction of the linearly-polarized-light component extracted by the polarizing plate (6). A light-reception unit (8) detects the intensity of the linearly-polarized-light component of the light extracted by the polarizing plate (6). A measurement unit (10) measures the refractive index of a sample (12) on the basis of the light intensity detected by the light-reception unit (8). The waveguide member (4) has a plurality of planar side surfaces (4Aa, 4Ab) for which one of the plurality of linearly-polarized-light components included in the entering light is p-polarized and that each have different responses to p-polarized light.
特許請求の範囲(英語) [claim1]
1. A plurality of different directions of polarization for the linearly polarized light component emits light containing a light-emitting, the light emitting unit from the light incident from the one end, a surface plasmon resonance phenomenon occurs in a part of the metal thin film formed after total reflection on the side, of the optical waveguide portion output from the other end of the elongate column and, wherein the light emitted from the optical waveguide portion in the direction of the linearly polarized light component of a particular polarization filter portion to extract, wherein the polarizing filter extracted at the linearly-polarized light component of light polarization direction of the light selection unit that selects, said polarizing filter sections of the linearly polarized light extracted by the intensity of the component and the optical intensity detecting section detecting, wherein the light intensity detected by the detection unit based on the light intensity, and refractive index of the sample to be measured, and, said waveguide section, the light incident on the plurality of linearly polarized light component included in any one of the polarized light which P, P polarization in response to a plurality of sides of planar differ from each other are formed, light refractive index measurement device.
[claim2]
2. Wherein the waveguide part, wherein a plurality of side surfaces, the first metal thin film is formed on the side surface of the 1, the metal thin film is not formed has a side surface of the first and 2, wherein the measurement unit, wherein the first polarization P 1 corresponds to the side of the selection unit selects the light intensity detection unit when the detected light intensity of the 1, wherein the first polarization P 2 corresponds to the side of said selection unit and the light intensity detection unit when it has been detected on the basis of the first and the optical intensity 2, refractive index of the sample is measured, the measurement apparatus according to claim 1 refractive index.
[claim3]
3. Wherein each of a plurality of side surfaces of the optical waveguide portion of the metal thin film is formed, the side surface of the film thickness or different for each type of metal, wherein the measurement unit, a plurality of side surfaces corresponding to each of the light intensity of the polarization P based on the measurement results, refractive index of the sample is measured, the measurement apparatus according to claim 1 refractive index.
[claim4]
4. Wherein in the optical waveguide portion, wherein the metal thin film is formed on the side surface is different in each position in the longitudinal direction, said measuring unit may, corresponding to each of a plurality of side surfaces of the light intensity of the polarization P based on the measurement results, and measuring the refractive index of a sample, detecting position information of the sample, according to claim 1 refractive index measurement device.
[claim5]
5. Wherein said waveguide section, each of the plurality of different areas of the metal thin film, formed along the longitudinal direction, said measuring unit may, corresponding to each of a plurality of side surfaces of the light intensity of the polarization P based on the measurement results, and measuring the refractive index of a sample, detecting positional information of the specimen, the measurement apparatus according to claim 1 refractive index.
[claim6]
6. An elongated pole, included in the plurality of the light incident on any one of the linearly-polarized light component of the polarized light which impinges P, respectively for the first polarization P in response to a plurality of sides of a planar shape different from that of the provided from one end of the waveguide member, a plurality of different directions of polarization for the linearly polarized light component and the light emitting unit from the incident light, wherein after totally reflected by the a plurality of side surfaces, and emitted from the other end of said waveguide member, wherein the light emitted from the optical waveguide portion in a specific direction in the linearly polarized light component while selectively extracted, the extracting of the linearly polarized light component that detects the intensity of, based on the light intensity is detected, measuring a refractive index of a sample, the method light refractive index measurement.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KAGOSHIMA UNIVERSITY
  • 発明者(英語)
  • HIGO MORIHIDE
  • MITSUSHIO MASARU
国際特許分類(IPC)
指定国 (WO201843194)
National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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