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SHAPE MEASURING DEVICE AND METHOD UPDATE

外国特許コード F190009678
整理番号 S2018-0542-N0
掲載日 2019年1月22日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2017JP036510
国際公開番号 WO 2018066698
国際出願日 平成29年10月6日(2017.10.6)
国際公開日 平成30年4月12日(2018.4.12)
優先権データ
  • 201662405512 (2016.10.7) US
発明の名称 (英語) SHAPE MEASURING DEVICE AND METHOD UPDATE
発明の概要(英語) This shape measuring device is provided with: a light source which radiates light having first and second wavelengths onto the surface of an object having reflectance factors with respect to the first and second wavelengths, via a medium having absorption coefficients at the first and second wavelengths; a sensor which receives light that has come from the surface of the object and has propagated through the medium, and which measures the intensities at the first and second wavelengths; and a measuring unit which calculates the distance from the surface of the medium to the surface of the object on the basis of the measured intensities at the first and second wavelengths, and on the basis of the absorption coefficients at the first and second wavelengths, and measures the shape of the object on the basis of the calculated distance. The first and second wavelengths are selected such that a difference between the intensity for a minimum distance at the first wavelength and the intensity for a maximum distance at the second wavelength is greater than a prescribed first value, and such that a difference between the reflectance factor at the first wavelength and the reflectance factor at the second wavelength is smaller than a prescribed second value.
従来技術、競合技術の概要(英語) BACKGROUND ART
Patent Document 1 is, three-dimensional imaging system 3 used in the absorption is disclosed. The three-dimensional image in the imaging system 3, a fluorescent medium between the object and the sensor excitation, the excitation light from an excitation light source 2 light of one wavelength is used to irradiate a light beam, the two-dimensional imaging system 3, which is reflected by the object sensor for receiving the light beam. Is a computer connected to the sensor, the first and the second intensity of the wavelength of 1 2 based on the ratio of the intensity of the wavelength, and determines the thickness of the medium, in the region of the object to determine a plurality of additional thickness, the area of the object to reconstruct a three-dimensional image 3.
In addition, Patent Document 2 is, the surface of the object to be measured with high accuracy in a short time and the shape measurement apparatus disclosed. Here, the shape measuring device can, through the medium and the illumination of the object, the object 2 reflected by one light beam having a wavelength of the sensor for receiving the light, the intensity of light of one wavelength 2 and the transmittance of the medium based on the, the distance to the surface of the measurement object and a measurement portion for measuring a feature of the.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • RESEARCH ORGANIZATION OF INFORMATION AND SYSTEMS
  • Drexel University
  • 発明者(英語)
  • SATO, Imari
  • ASANO, Yuta
  • ZHENG, Yinqiang
  • NISHINO, Ko
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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