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MEASUREMENT DEVICE AND IRRADIATION DEVICE

外国特許コード F190009818
整理番号 E120P08WO
掲載日 2019年5月9日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2018JP029924
国際公開番号 WO 2019031584
国際出願日 平成30年8月9日(2018.8.9)
国際公開日 平成31年2月14日(2019.2.14)
優先権データ
  • 特願2017-154392 (2017.8.9) JP
発明の名称 (英語) MEASUREMENT DEVICE AND IRRADIATION DEVICE
発明の概要(英語) This measurement device comprises: a light emission unit that emits a plurality of spectral beams including two or more spectra respectively distributed over different frequencies, the light emission unit emitting the spectral beams by varying the neighbouring frequency intervals from one another; a beam-condensing unit that condenses, respectively onto a plurality of different beam-condensing point regions on a sample, said two or more spectra by shifting the same from one another while causing the same to overlap one another in overlapping regions; and a detection unit that acquires signals of fluorescence beats including information on the sample and lighting up by interference light beats in the respective overlapping regions of the sample.
従来技術、競合技術の概要(英語) BACKGROUND ART
Conventional, and the fluorescent imaging optical microscope, a fluorescent microscope with a confocal optical system (hereinafter, a confocal fluorescence microscope) has been known (for example, see Patent Document 1).
A conventional optical microscope of the specimen is uniformly irradiated with a predetermined range on the other hand, in the confocal optical system is a point source of illumination light emitted from the sample by the objective lens of the light focused on one point. As the irradiation light, excellent color and directionality of a laser light is used. In addition, in the confocal optical system is, at a position conjugate with the focal position of the objective lens by arranging a pinhole, the fluorescence of the sample is in focus only at a position passing through the pinhole is detected.
In this way is the confocal optical system, first the irradiation light is focused on the point 1 of the sample, the fluorescence from the focal position of the sample while passing through the pinhole, the pinhole of the fluorescence from other than the focal position to be cut off. Thus, a confocal optical system, an ordinary optical microscope, the focal point adjacent to the horizontal direction, and focal plane on the front side or from the back side without the influence of the stray light, the contrast is increased. Result, only the focus position of the irradiation light so that the information is detected, a two-dimensional spatial resolution 3.
Clear 3 a two-dimensional image as described above can be formed by confocal fluorescence microscope, for example using a fluorescent protein such as biotechnology fields such as a vital function analysis, used in wide fields. Further, from the viewpoint of having high resolution and quantitation, confocal fluorescent microscope also in the future for increasing the importance of the considered.
On the other hand, in the confocal fluorescent microscope can only be obtained the focus position of the point information. Therefore, in the confocal fluorescent microscope, the sample plane 2 for imaging three-dimensional information, the irradiation light emitted from the point light source within the sample relative to the focal position of the scanning is necessary. In this way the focal position of the irradiated light relative to the sample and scanning the scanning device, a galvanometer mirror has been known. However, the scanning device may be used, a wide range of high-speed scanning is time-consuming.
As a technique to address the above-described circumstances, for example in Patent Document 2, the spectrum emitted by the light source point for each of 2 discrete two-dimensionally dispersed in the sample, the sample corresponding to each measurement point of the time-resolved spectrum obtained in one mode the measuring device is described. A measuring device is, the position information of the spectrum incident on the sample corresponding to the frequency of the spectrum, to obtain information of a sample. Therefore, in the sample plane 2 can be imaged without scanning the two-dimensional information.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • YASUI Takeshi
  • IWATA Tetsuo
  • MIZUTANI Yasuhiro
  • MINAMIKAWA Takeo
  • MIZUNO Takahiko
  • HASE Eiji
  • YAMAMOTO Hirotsugu
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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