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CURVATURE DETECTION SENSOR NEW

外国特許コード F190009939
整理番号 (S2018-0048-N0)
掲載日 2019年10月24日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2018JP043967
国際公開番号 WO 2019124019
国際出願日 平成30年11月29日(2018.11.29)
国際公開日 令和元年6月27日(2019.6.27)
優先権データ
  • 特願2017-244241 (2017.12.20) JP
発明の名称 (英語) CURVATURE DETECTION SENSOR NEW
発明の概要(英語) Provided is a curvature detection sensor that is capable of accurately and repeatedly measuring distortion of a to-be-measured object over a large curvature change. This curvature detection sensor is characterized by being formed by joining together a first metal sheet and a second metal sheet having elastic limits of 1% or more and having Young's moduli different from each other.
従来技術、競合技術の概要(英語) BACKGROUND ART
Conventional, generally known as a strain gauge (curvature detection sensor), and a metal strain gauge and semiconductor strain gauges. Among these, the metal strain gauges, for example, a resin film on a thin insulating layer, a metal line (metal foil) and the resistance body in a zigzag pattern and formed on a (for example, see Patent Document 1). Such a metal strain gauge or the like adhered to the measurement object, the deformation of the object to be measured, and the metal line in response to the deformation and contraction, to change the electrical resistance of the metal wire. Such a change in electrical resistance value is detected, to measure the distortion of the measurement object can be.
In addition, the semiconductor strain gauges, the electrical resistivity of the semiconductor varies depending on the stress applied to the resistance of the piezoresistive effect and, the measurement object corresponding to the deformation of the deformation of the semiconductor and, due to the deformation of the semiconductor crystal structure of the motion potential changes. Thus, carrier mobility in the semiconductor is changed, since the electrical resistance changes, this change in electrical resistance can be detected, to measure the distortion of the measurement object can be.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • UNIVERSITY OF TSUKUBA
  • 発明者(英語)
  • KOYANO Tamotsu
  • KIM Hee Young
  • AMEMIYA Taiki
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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