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CURVATURE DETECTION SENSOR NEW_EN

Foreign code F190009939
File No. (S2018-0048-N0)
Posted date Oct 24, 2019
Country WIPO
International application number 2018JP043967
International publication number WO 2019124019
Date of international filing Nov 29, 2018
Date of international publication Jun 27, 2019
Priority data
  • P2017-244241 (Dec 20, 2017) JP
Title CURVATURE DETECTION SENSOR NEW_EN
Abstract Provided is a curvature detection sensor that is capable of accurately and repeatedly measuring distortion of a to-be-measured object over a large curvature change. This curvature detection sensor is characterized by being formed by joining together a first metal sheet and a second metal sheet having elastic limits of 1% or more and having Young's moduli different from each other.
Outline of related art and contending technology BACKGROUND ART
Conventional, generally known as a strain gauge (curvature detection sensor), and a metal strain gauge and semiconductor strain gauges. Among these, the metal strain gauges, for example, a resin film on a thin insulating layer, a metal line (metal foil) and the resistance body in a zigzag pattern and formed on a (for example, see Patent Document 1). Such a metal strain gauge or the like adhered to the measurement object, the deformation of the object to be measured, and the metal line in response to the deformation and contraction, to change the electrical resistance of the metal wire. Such a change in electrical resistance value is detected, to measure the distortion of the measurement object can be.
In addition, the semiconductor strain gauges, the electrical resistivity of the semiconductor varies depending on the stress applied to the resistance of the piezoresistive effect and, the measurement object corresponding to the deformation of the deformation of the semiconductor and, due to the deformation of the semiconductor crystal structure of the motion potential changes. Thus, carrier mobility in the semiconductor is changed, since the electrical resistance changes, this change in electrical resistance can be detected, to measure the distortion of the measurement object can be.
Scope of claims (In Japanese)[請求項1]
 弾性限が1%以上で、ヤング率が互いに異なる第1金属板と第2金属板とを接合してなることを特徴とする湾曲検出センサ。

[請求項2]
 前記第1金属板のヤング率が40GPa以下で、かつ前記第2金属板のヤング率が40GPaよりも大きいことを特徴とする請求項1記載の湾曲検出センサ。

[請求項3]
 前記第2金属板は、ヤング率が50GPa以上であることを特徴とする請求項2記載の湾曲検出センサ。

[請求項4]
 前記第1金属板および前記第2金属板の弾性限は、1.2%以上であることを特徴とする請求項1ないし3いずれか一項記載の湾曲検出センサ。

[請求項5]
 前記第1金属板および前記第2金属板は、Ti-Nb基合金からなることを特徴とする請求項1ないし4いずれか一項記載の湾曲検出センサ。

[請求項6]
 前記第1金属板と前記第2金属板とは、複数のスポット溶接部によって接合されていることを特徴とする請求項1ないし5いずれか一項記載の湾曲検出センサ。

[請求項7]
 前記第1金属板および前記第2金属板は、圧延合金板であることを特徴とする請求項1ないし6いずれか一項記載の湾曲検出センサ。

[請求項8]
 弾性限が1%以上で、かつヤング率が互いに同じで、比抵抗が互いに異なる第3金属板と第4金属板とを接合してなることを特徴とする湾曲検出センサ。
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • UNIVERSITY OF TSUKUBA
  • Inventor
  • KOYANO Tamotsu
  • KIM Hee Young
  • AMEMIYA Taiki
IPC(International Patent Classification)
Specified countries National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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