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LEARNING DEVICE, LEARNING METHOD, AND PROGRAM FOR LEARNING DEVICE, AS WELL AS INFORMATION OUTPUT DEVICE, INFORMATION OUTPUT METHOD, AND INFORMATION OUTPUT PROGRAM NEW

外国特許コード F190009968
整理番号 (S2018-0315-N0)
掲載日 2019年10月25日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2019JP003420
国際公開番号 WO 2019151411
国際出願日 平成31年1月31日(2019.1.31)
国際公開日 令和元年8月8日(2019.8.8)
優先権データ
  • 特願2018-017044 (2018.2.2) JP
発明の名称 (英語) LEARNING DEVICE, LEARNING METHOD, AND PROGRAM FOR LEARNING DEVICE, AS WELL AS INFORMATION OUTPUT DEVICE, INFORMATION OUTPUT METHOD, AND INFORMATION OUTPUT PROGRAM NEW
発明の概要(英語) Provided is a learning device capable of generating learning pattern information for causing meaningful output information corresponding to input information to be accurately output, while reducing the amount of learning data needed to generate the learning pattern corresponding to the input information. When generating learning pattern data PD for obtaining meaningful output corresponding to image data GD, the learning pattern data PD corresponding to the results of deep-layer learning processing using the image data GD, the learning device: acquires, from an external source, external data BD corresponding to the image data GD; on the basis of a correlation between image feature data GC indicating a feature of the image data GD and external feature data BC indicating a feature of the external data BD, converts the image feature data GC; and generates converted image feature data MC. Subsequently, the generated converted image feature data MC is used to execute deep-layer learning processing, and learning pattern data PD is generated.
従来技術、競合技術の概要(英語) BACKGROUND ART
In recent years, machine learning, especially for deep learning and active research is being conducted. Such a study is disclosed as prior art document, for example the following Non-Patent Document 1 and Non-patent Document 2 and the like. In these studies, a highly accurate recognition can be classified.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • HOKKAIDO UNIVERSITY
  • 発明者(英語)
  • HASEYAMA Miki
  • OGAWA Takahiro
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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