|発明の名称||OPTICAL CHARACTERISTIC MEASURING APPARATUS, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, AND PROGRAM AND STORAGE MEDIUM USED FOR IT|
PROBLEM TO BE SOLVED: To provide an optical characteristic measuring apparatus and method capable of performing in environments where wide variations in fluctuation and temperature are encountered and regardless of the type of an object to be measured, that a measurement frequency range is wide, and that the measurement accuracy is high.
SOLUTION: The optical characteristic measuring apparatus 10 comprises a non-linear optical crystal 2 which generates a pair of photons A, B and emits the photon A to an optical element 4, an optical delay circuit 6 which change the optical path difference between the photon A and the photon B, a beam splitter 5 which allows the photons A, B to transmit and reflects, mixes the reflected component of the photon A and the transmitted component of the photon B to be guided to a photon detector 7A, and mixes the transmitted component of the photon A and the reflected component of the photon B to be guided to a photon detector 7B, a coincidence counter 8 which measures the frequency of coincidence photon detection by the photon detectors 7A, 7B as a coincidence measurement ratio, and an analyzer 9 which determines a change in the coincidence measurement ratio with respect to a change in the optical path difference from the measured coincidence measurement ratio and calculates the wavelength dependence of the optical property of the optical element 4 on the basis of a value of a dip part in the change in the coincidence measurement ratio.
- 北海道大学 産学・地域協働推進機構 産学推進本部
- URL: http://www.mcip.hokudai.ac.jp/cms/cgi-bin/index.pl
- Address: 〒001-0021 北海道札幌市北区北二十一条西11丁目 北キャンパス総合研究棟3号館
- TEL: 011-706-9554
- FAX: 011-706-9550