|発明の名称||DLP TYPE SLIT OPTICAL SCANNING MICROSCOPE|
PROBLEM TO BE SOLVED: To provide a DLP type slit optical scanning microscope capable of attaining slit light illumination by irradiating a sample with slit light under the control of a DMD, and capable of easily adjusting the position and the extent of the illuminating light on the sample and the thickness (size) of the slit through which the sample is irradiated.
SOLUTION: Laser beams are diverged through a concave lens 2, and then, converged on the back focal plane of a super high numerical aperture objective lens 7. In the DMD apparatus 4, the on-control of a micromirror is performed into a slit-shape. The slit light is reflected by a dichroic mirror 5, transmitted through the back focal plane, and then, made incident on the super high numerical aperture objective lens 7, then, refracted so as to reach the sample such as cells on a cover glass 8. The light is obliquely made incident on the sample, and the cut surface is irradiated with the light in the slit-shape.
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