|発明の名称||MEASURING DEVICE FOR OBJECT|
PROBLEM TO BE SOLVED: To provide a measuring device capable of measuring thickness and location of a measured object simply, quickly, and surely with a single measuring means (sensor) by the use of optical thickness and electrical property of the measured object consisting of transparent body or conductive material.
SOLUTION: The measuring device for object, where when the measured object 100 is transparent body, any opaque member is arranged at its backside, and when conductive material, any non-conductive material is arranged at its backside, while light is irradiated to the measured object concerned to receive reflected light from the object, and a plurality of photoconductive elements changing resistance of two electrodes due to light of the received light concerned are arranged separately at a predetermined interval, is equipped with: a detecting means 2, in which while an AC power supply is connected to at least one side of electrode of a photoconductive element of a plurality of photoconductive elements, one side of electrode of other photoconductive elements is formed as an output terminal; a basis database memory 32, in which thickness and positional information for the measured object detected preliminary are stored as a reference data; and a discriminating means 3 discriminating thickness and location of the measured object based on the detected signal and the reference data from the detecting means.
- 国立大学法人佐賀大学 産学・地域連携機構 知財戦略・技術移転部門
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