|発明の名称||DEFECT DIAGNOSIS DEVICE|
PROBLEM TO BE SOLVED: To provide a defect diagnosis device that can efficiently detect defect of an electronic device having a semiconductor element such as a solar battery or the like.
SOLUTION: A defect diagnosis device has an acquiring part for acquiring a duty ratio for controlling an output voltage of an electronic device having a semiconductor element to a target voltage, a first calculator for calculating an integrated duty ratio obtained by the output voltage is varied and integrated with plural sine waves having different frequencies with the duty ratio as a reference, a second calculator for calculating an impedance of each frequency to the target voltage on the basis of the output voltage and output current of the electronic device when the integrated duty ratio is controlled by turn on/off of plural switches, and a determining part for generating characteristic information representing the frequency characteristic of the electronic device on the basis of the impedance of each frequency, collating the generated characteristic information and pre-generated characteristic information and determining the presence or absence of a defect of the semiconductor element or the electronic device.
- 東京理科大学 研究戦略・産学連携センター
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