|発明の名称||SPECTRAL CHARACTERISTIC MEASURING DEVICE|
PROBLEM TO BE SOLVED: To provide a spectral characteristic measuring device capable of obtaining a clear interferogram.
SOLUTION: A spectral characteristic measuring device includes: a division optical system for dividing measurement light emitted respectively from a plurality of measuring points of an object to be measured into first measurement light and second measurement light; an image forming optical system for forming interference light of the first and second measurement light on an image forming surface; optical path length difference distribution means for giving a continuous optical length difference between the first and second measurement light; an interference light detection part having a plurality of pixels; a processing part for obtaining an interferogram based on the light intensity of the interference light detected by the interference light detection part and obtaining a spectrum by subjecting this interferogram to a Fourier transformation; a conjugate surface image forming optical system having a conjugate surface common to the division optical system installed between the object to be measured and the division optical system; and an amplitude type diffraction grating having a plurality of rectangular opening parts arranged on the conjugate surface.
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