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(In Japanese)計測対象物の面外変位分布や3次元形状を計測する方法とその装置 (Patent unpublished to the public) commons

Patent code P190016099
File No. FU819
Posted date Jun 12, 2019
Application number P2019-009215
Date of filing Jan 23, 2019
Inventor
  • (In Japanese)藤垣元治
  • (In Japanese)後藤優太
  • (In Japanese)川原滉平
Applicant
  • (In Japanese)国立大学法人福井大学
Title (In Japanese)計測対象物の面外変位分布や3次元形状を計測する方法とその装置 (Patent unpublished to the public) commons
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