|発明の名称||METHOD FOR MEASURING CURRENT AND DEVICE FOR MEASURING SURFACE SHAPE|
PROBLEM TO BE SOLVED: To provide a method for measuring current flowing through a sample having weak mechanical strength or a sample having uneven hardness by applying voltage to a substrate, and bringing a conductive probe into contact with the sample arranged on the substrate with being vibrated, at constant force and in the specified cycle, and provide a device for measuring the surface and a microscope device.
SOLUTION: This method for measuring current contains a step applying voltage to the conductive substrate 1 on which the sample 2 is arranged; a step vibrating the conductive probe 3 so as to come in contact with the sample 2 at the constant force and in the specified cycle; and a step bringing the probe 3 into contact with the sample 2 and measuring current flowing between the probe 3 and the sample 2. The device for measuring the surface and the microscope device are used.
- 国立大学法人静岡大学 イノベーション社会連携推進機構
- URL: http://www.oisc.shizuoka.ac.jp/
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