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* Published Japanese patents only


Hits 29 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2017-104533 P2018-200210A PRESSURING POSITION SENSOR, PRESSURING POSITION DETECTION METHOD, PRESSURING POSITION DETECTION DEVICE AND CODING TEXTILE Feb 25, 2019 Jan 6, 2020 University of Yamanashi
2 P2018-085731 P2018-185312A POSITION DETECTOR, MODEL LEARNING DEVICE, POSITION DETECTION SYSTEM, AND PROGRAM meetings Jan 23, 2019 Jan 29, 2020 Tokyo University of Science
3 P2015-539166 P6420246 (In Japanese) 長さ測定装置、長さ測定方法、プログラム、形状推定装置、及び体脂肪率測定装置 Apr 7, 2017 Nov 20, 2018 The Kitasato Institute Kitasato University
4 P2014-511006 P5593007 (In Japanese) 走査型トンネル顕微鏡および観察画像表示方法 Mar 18, 2015 Dec 18, 2017 Japan Science and Technology Agency
5 P2014-221143 P6445841 MEASUREMENT DEVICE meetings Dec 5, 2014 Jan 18, 2019 Tokyo Denki University
6 P2012-203990 P6095201 SENSING SYSTEM Mar 11, 2013 Dec 21, 2017 Shinshu University
7 P2012-137209 P6083960 ABRASION SENSOR meetings Sep 26, 2012 Dec 26, 2017 University of Fukui
8 P2009-259334 P5561717 RING-SHAPED BOSE EINSTEIN CONDENSATE AND DARK SOLITON FORMED IN THE SAME, METHOD FOR FORMING THE DARK SOLITON, AND EXTERNAL-FIELD MEASURING METHOD USING THESE Apr 3, 2012 Jan 25, 2018 University of Fukui
9 P2006-352957 P4910143 WEAR GAUGE meetings Aug 18, 2011 Feb 22, 2018 University of Fukui
10 P2006-219452 P4887496 MAGNETIC FIELD DISTRIBUTION MEASURING APPARATUS Aug 18, 2011 Feb 22, 2018 UTSUNOMIYA UNIVERSITY
11 P2006-511794 P4551395 (In Japanese) 生体内3次元運動測定装置及びその方法 Jul 1, 2011 Jan 29, 2020 Japan Science and Technology Agency
12 P2004-246138 P4072914 ABRASION SENSOR WITH CONDUCTIVE FILM FORMED ON ITS SURFACE May 20, 2011 Feb 28, 2018 University of Fukui
13 P2010-292988 P5704696 BIOCOMPATIBLE POLYMER SENSOR AND METHOD FOR MANUFACTURING THE SAME meetings Jan 11, 2011 Mar 28, 2018 Japan Science and Technology Agency
14 P2008-129218 P5320651 DEFORMATION IN-SITU DISPLAY DEVICE OF NATURAL AND ARTIFICIAL STRUCTURE BY LIGHT COLOR meetings achieved Jan 15, 2010 Feb 2, 2018 Kobe University
15 P2007-510365 P4639339 (In Japanese) 非破壊検査方法及び装置 meetings foreign Jan 15, 2010 Feb 19, 2018 Kyushu Institute of Technology
16 P2006-322662 P4839481 PUMP PROBE MEASURING INSTRUMENT AND SCANNING PROBE MICROSCOPE Jun 27, 2008 Feb 23, 2018 Japan Science and Technology Agency
17 P2003-004364 P3837531 MICROSCOPE, MICRO-PLASMA ARRAY FOR MICROSCOPE, METHOD OF OBSERVING SURFACE, AND METHOD OF REFORMING SURFACE Dec 28, 2007 Mar 14, 2018 Saitama University
18 P2003-007438 P3858093 APPARATUS AND METHOD FOR GENERATING MICRO-PLASMA AND PLASMA ARRAY MICROSCOPE Dec 28, 2007 Mar 14, 2018 Saitama University
19 P2006-062659 P4465476 MOTION CAPTURE DEVICE FOR FINGER USING MAGNETIC POSITION/POSTURE SENSOR Nov 2, 2007 Feb 22, 2018 Akita University
20 P2006-000007 P4534045 HETERODYNE BEAT PROBE SCANNING PROBE MICROSCOPE AND MEASURING METHOD OF MICROSIGNAL SUPPERPOSED ON TUNNEL CURRENT USING IT Jul 27, 2007 Feb 22, 2018 University of Tsukuba
21 P2005-240479 P4644809 OBJECT MEASURING APPARATUS Apr 27, 2007 Mar 5, 2018 Saga University TLO
22 P2005-270889 P4461257 APPARATUS FOR MEASURING ELECTRON EMISSION DISTRIBUTION Apr 13, 2007 Mar 5, 2018 University of Tsukuba
23 P2004-220721 P4427665 BENDING DEFORMATION SENSOR AND DEFORMATION MEASURING DEVICE Mar 7, 2006 Mar 7, 2018 HIROSHIMA UNIVERSITY
24 P2003-326034 P4310159 MAGNETIC GENERATOR, AND INSTRUMENT AND METHOD FOR MEASURING THREE-DIMENSIONAL MOTION Apr 15, 2005 Jan 29, 2020 Japan Science and Technology Agency
25 P2001-105971 P3482468 STRESS MEASUREMENT SENSOR Mar 18, 2005 Mar 20, 2018 Japan Aerospace Exploration Agency
26 P2000-372814 P3551308 CURRENT-MEASURING METHOD AND SURFACE MEASURING APPARATUS Jan 18, 2005 Apr 6, 2012 Shizuoka University
27 P2001-064937 P3551315 METHOD FOR MEASURING CURRENT AND DEVICE FOR MEASURING SURFACE SHAPE Jan 18, 2005 Mar 20, 2018 Shizuoka University
28 P2001-059440 P3472828 SCANNING MAGNETIC DETECTOR, AND PROBE FOR SCANNING MAGNETIC DETECTOR Aug 28, 2003 Mar 20, 2018 Hokkaido University
29 P2001-058528 P3527947 PROBE, ITS MANUFACTURING METHOD, AND MICROSCOPE AND TESTER HAVING PROBE Aug 28, 2003 Mar 20, 2018 Hokkaido University

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