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* Published Japanese patents only


Hits 20 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2018-567549 WO2018147473 (In Japanese) 3次元物体情報計測装置 meetings Feb 25, 2020 Feb 25, 2020 Kyoto Institute of Technology
2 P2018-502540 WO2017149912 (In Japanese) 形状測定方法及び形状測定装置 meetings Feb 22, 2019 Jan 8, 2020 The University of Electro-Communications
3 P2016-062591 P6684623 INTERFERENCE TYPE RANGE-FINDING METER AND PERFECT RETROREFLECTOR meetings Feb 1, 2019 Jun 5, 2020 HOSEI UNIVERSITY
4 P2015-220789 P6635758 METHOD FOR CORRECTING REFRACTIVE INDEX, AND METHOD AND DEVICE FOR MEASURING DISTANCE Jun 30, 2017 Feb 20, 2020 The University of Electro-Communications
5 P2014-538203 P6202499 (In Japanese) 光位相測定方法、光位相測定装置および光通信装置 Nov 4, 2016 Dec 20, 2017 Hokkaido University
6 P2014-539666 P6192017 (In Japanese) デジタルホログラフィ装置 Nov 2, 2016 Dec 20, 2017 Kyoto Institute of Technology
7 P2015-129055 P5970682 EYEBALL MEASUREMENT DEVICE AND EYEBALL MEASUREMENT METHOD Mar 29, 2016 Dec 18, 2017 The Kitasato Institute Kitasato University
8 P2014-109489 P6327641 LASER SCANNING INTERFEROMETER AND SURFACE SHAPE MEASUREMENT METHOD meetings Oct 21, 2015 Jun 20, 2018 Niigata University
9 P2010-550426 P5648193 (In Japanese) 干渉計測装置および干渉計測方法 meetings Feb 25, 2014 Jan 19, 2018 Kyoto Institute of Technology
10 P2009-255138 P5552707 REPRODUCING DEVICE, INTERFERENCE MEASURING DEVICE, CONTROL PROGRAM, AND RECORDING MEDIUM meetings Nov 19, 2012 Jan 29, 2018 Kyoto Institute of Technology
11 P2007-505995 P4489804 (In Japanese) ホモダインレーザ干渉計プローブ及びそれを用いた変位計測システム Jul 6, 2011 Feb 9, 2018 Japan Science and Technology Agency
12 P2001-114898 P3539726 HIGH SPEED OPTICAL RETARDATION GENERATING METHOD AND OPTICAL COHERENCE TOMOGRAPHY DEVICE BY ROTATING REFLECTOR IN OPTICAL COHERENCE TOMOGRAPHY achieved Jun 8, 2011 Mar 19, 2018 Japan Science and Technology Agency
13 P2001-572826 P4164261 (In Japanese) 干渉計測装置 achieved Jun 8, 2011 Mar 19, 2018 Japan Science and Technology Agency
14 P2009-107207 P5258052 SHAPE MEASURING METHOD AND SHAPE MEASURING DEVICE BY PHASE SHIFT METHOD, COMPLEX AMPLITUDE MEASURING METHOD, AND COMPLEX AMPLITUDE MEASURING DEVICE Dec 13, 2010 Jan 25, 2018 UTSUNOMIYA UNIVERSITY
15 P2010-095569 P5743419 SHAPE MEASUREMENT METHOD, SHAPE MEASUREMENT DEVICE, DISTORTION MEASUREMENT METHOD, AND DISTORTION MEASUREMENT DEVICE Dec 13, 2010 Jan 18, 2018 UTSUNOMIYA UNIVERSITY
16 P2005-258340 P4161059 AUTOMATIC MEASURING PROCESSOR OF MINUTE DISPLACEMENT OF ONE POINT IN DIFFUSING SURFACE meetings Jan 12, 2010 Feb 28, 2018 Toyota National College of Technology
17 P2009-054042 P5117430 LIGHT-BRANCHING DEVICE meetings Jun 26, 2009 Jan 19, 2018 Saitama University
18 P2006-219881 P4843789 METHOD AND APPARATUS FOR MEASURING NANOMETER DISPLACEMENT BY LASER SPECKLE Mar 10, 2008 Feb 22, 2018 University of TOYAMA
19 P2004-290013 P4501000 METHOD AND APPARATUS FOR MEASURING LASER INTERFERENCE DISPLACEMENT Jan 9, 2007 Mar 13, 2018 Niigata University
20 P2001-052263 P3493552 OPTICAL FIBER MAGNETIC SENSOR Dec 2, 2005 Mar 20, 2018 Japan Defense Agency

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