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* Published Japanese patents only


Hits 57 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2018-181563 P2020-051895A NUCLEAR MATERIAL DETECTOR Jul 20, 2020 Aug 24, 2020 Japan Atomic Energy Agency
2 P2018-200792 P2020-067392A ELEMENT ANALYSIS METHOD, AND ELEMENT ANALYZER Jul 20, 2020 Aug 24, 2020 Japan Atomic Energy Agency
3 P2013-557542 P6099053 (In Japanese) 微結晶構造解析装置、微結晶構造解析方法及びX線遮蔽装置 achieved foreign Apr 6, 2020 May 20, 2020 Kyoto University
4 P2019-502851 WO2018159272 (In Japanese) 時間分解光電子顕微鏡装置および当該装置によるキャリアダイナミクス画像の取得方法 Mar 24, 2020 Mar 24, 2020 Tokyo Institute of Technology
5 P2018-160921 P2020-034410A OBSERVATION METHOD OF PATHOLOGICAL TISSUE SPECIMEN OR CYTOLOGY SPECIMEN BY SCANNING ELECTRON MICROSCOPE Mar 24, 2020 Jul 17, 2020 HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE
6 P2018-542666 WO2018062308 (In Japanese) X線CT装置、電子密度及び実効原子番号の測定方法、CT検査方法、検査方法 Aug 27, 2019 Jan 8, 2020 Gunma University
7 P2015-012864 P6528264 IMAGING DEVICE AND IMAGING METHOD Aug 23, 2019 Oct 2, 2019 RIKEN
8 P2017-239693 P2019-105598A POSITRON ANNIHILATION LIFETIME MEASURING DEVICE, ADJUSTMENT METHOD OF RADIATION DETECTOR AND RADIATION DETECTOR meetings Aug 2, 2019 Jan 7, 2020 Japan Atomic Energy Agency
9 P2017-204584 P2019-078593A CRYSTAL ARRAY DETECTOR, SMALL ANGLE SCATTERING MEASUREMENT DEVICE AND SMALL ANGLE SCATTERING MEASUREMENT DEVICE Jun 24, 2019 Dec 26, 2019 Ibaraki University
10 P2015-126296 P6607486 INTRACELLULAR MEMBRANE STRUCTURE-FORMATION METHOD AND INTRACELLULAR MEMBRANE STRUCTURE-OBSERVATION METHOD meetings Jun 13, 2019 Dec 25, 2019 National Institute of Information and Communications Technology
11 P2007-551145 P4759750 (In Japanese) 曲率分布結晶レンズの製造方法、偏光制御装置、X線反射率測定装置およびX線反射率測定方法 Nov 21, 2018 Nov 21, 2018 Kyoto University
12 P2006-532583 P4710022 (In Japanese) 曲率分布結晶レンズ、曲率分布結晶レンズを有するX線装置及び曲率分布結晶レンズの作製方法 Nov 21, 2018 Nov 21, 2018 Kyoto University
13 P2014-544557 P6179994 (In Japanese) 元素分析装置 Nov 21, 2018 Nov 21, 2018 Kyoto University
14 P2017-054108 P2018-155680A CASSETTE LOADING DEVICE Nov 1, 2018 Dec 24, 2019 High Energy Accelerator Research Organization
15 P2010-227866 P5585959 MOUNT DEVICE Oct 2, 2018 Oct 31, 2018 RIKEN
16 P2016-089094 P6664133 STANDARD SAMPLE WITH INCLINED SUPPORT TABLE, METHOD FOR EVALUATING SCAN TYPE ELECTRON ELECTROSCOPE AND METHOD OF EVALUATING SIC SUBSTRATE foreign Jan 24, 2018 Mar 18, 2020 Kwansei Gakuin University
17 P2016-538444 P6534668 (In Japanese) 回折データの解析方法、コンピュータプログラム及び記録媒体 Aug 16, 2017 Jul 23, 2019 Japan Science and Technology Agency
18 P2016-105618 P6692092 STRESS MEASUREMENT METHOD AND STRESS MEASUREMENT DEVICE Jul 12, 2017 Jun 9, 2020 Kanazawa UniversityTLO(KUTLO)
19 P2015-559988 P6452630 (In Japanese) 含水状態の生物試料の電子顕微鏡観察用保護剤、電子顕微鏡観察用キット、電子顕微鏡による観察、診断、評価、定量の方法並びに試料台 meetings Jun 23, 2017 Feb 22, 2019 Japan Science and Technology Agency
20 P2014-533051 P6164748 (In Japanese) 核物質探知装置及び核物質探知方法 Nov 4, 2016 Dec 19, 2017 Kyoto University
21 P2015-036074 P6525189 STANDARD SAMPLE FOR CALIBRATING OBSERVATION CONTRAST IN SCANNING ELECTRON MICROSCOPE, AND METHOD OF INSPECTING CRYSTALLINE SUBSTRATE USING SCANNING ELECTRON MICROSCOPE Apr 19, 2016 Jun 20, 2019 Kwansei Gakuin University
22 P2015-117985 P6692108 ANALYSIS DEVICE AND ANALYSIS SYSTEM Jan 25, 2016 Jun 9, 2020 University of Tsukuba
23 P2015-050553 P6707249 MICRO FAULT VISUALIZATION METHOD AND SYSTEM meetings Nov 2, 2015 Jul 1, 2020 Meijo University
24 P2013-198163 P6411722 MAGNETIC CHARACTERISTICS MEASUREMENT METHOD Sep 4, 2015 Nov 19, 2018 High Energy Accelerator Research Organization
25 P2014-213211 P5842242 DIFFRACTION RING ANALYSIS METHOD AND DIFFRACTION RING ANALYZER Sep 1, 2015 Dec 20, 2017 Kanazawa UniversityTLO(KUTLO)
26 P2013-216799 P6313010 DIFFRACTION RING MEASUREMENT APPARATUS meetings Sep 1, 2015 May 22, 2018 Kanazawa UniversityTLO(KUTLO)
27 P2012-150939 P6011846 X-RAY STRESS MEASUREMENT METHOD Sep 1, 2015 Dec 25, 2017 Kanazawa UniversityTLO(KUTLO)
28 P2014-167309 P6602001 X-RAY INTENSITY MODULATION METHOD AND X-RAY POLARIZATION STATE ANALYSIS METHOD Mar 24, 2015 Nov 21, 2019 Shinshu University
29 P2012-273064 P6206901 SCATTERING INTENSITY DISTRIBUTION MEASUREMENT METHOD AND MEASUREMENT DEVICE Feb 18, 2015 Dec 27, 2017 High Energy Accelerator Research Organization
30 P2003-047422 P4154689 PLASTIC STANDARD MATERIAL AND ITS MANUFACTURING METHOD Oct 30, 2014 Mar 15, 2018 Meiji University
31 P2013-049697 P6179885 MEASUREMENT METHOD OF AMOUNT OF FISSILE MATERIAL AND MEASUREMENT DEVICE Oct 10, 2014 Dec 20, 2017 Japan Atomic Energy Agency
32 P2009-047165 P5489032 ION BEAM ANALYZER EXCELLENT IN BEAM QUANTITY MEASURING FUNCTION Jun 6, 2014 Jan 25, 2018 Wakasa Wan Energy Research Center
33 P2013-142594 P6114938 X-RAY DIFFRACTOMETER BUILT-IN ATMOSPHERE CONTROL GLOVE BOX DEVICE AND METHOD FOR MANUFACTURING THE SAME Feb 28, 2014 Dec 19, 2017 Kyoto University
34 P2012-032066 P5919024 SPECIFIC SURFACE AREA MEASUREMENT METHOD AND DEVICE FOR THIN-FILM SAMPLE Feb 27, 2014 Dec 21, 2017 HIROSHIMA UNIVERSITY
35 P2012-071442 P5904835 SAMPLE HOLDING DEVICE, AND SAMPLE ANALYSIS METHOD meetings Oct 28, 2013 Dec 25, 2017 Kwansei Gakuin University
36 P2012-063526 P5975462 ABLATION APPARATUS AND THREE-DIMENSIONAL ELECTRON MICROSCOPE Oct 17, 2013 Dec 25, 2017 Kyushu University
37 P2009-530180 P4973960 (In Japanese) 曲率分布結晶レンズおよびX線反射率測定装置 foreign Jul 10, 2013 Jan 29, 2018 Kyoto University
38 P2011-502802 P5403767 (In Japanese) 原子核共鳴蛍光散乱を用いた非破壊検査システム foreign Jul 10, 2013 Jan 17, 2018 Kyoto University
39 P2008-223054 P5339584 ELECTRON PERMEABLE FILM, AND METHOD FOR MANUFACTURING THE SAME meetings May 8, 2013 Jan 30, 2018 Josho Gakuen Educational Foundation
40 P2007-514601 P4568801 (In Japanese) フレネルゾーンプレート及び該フレネルゾーンプレートを使用したX線顕微鏡 Nov 19, 2012 Feb 19, 2018 Kyoto Institute of Technology
41 P2011-033264 P5834422 PARTICLE ORIENTATION APPARATUS AND PARTICLE ORIENTATION METHOD meetings Sep 28, 2012 Jan 17, 2018 Kyoto University
42 P2010-527698 P5846469 (In Japanese) 全反射蛍光X線分析装置及び全反射蛍光X線分析方法 meetings achieved Jun 14, 2012 Jan 18, 2018 Kyoto University
43 P2010-232524 P5641503 MULTI-STEP LATTICE VOXEL METHOD May 14, 2012 Jan 21, 2019 University of Tsukuba
44 P2010-146206 P5553308 LIGHT ELEMENT ANALYZER AND ANALYZING METHOD meetings Jan 10, 2012 Sep 30, 2019 RIKEN
45 P2005-263339 P4825972 METHOD OF FINDING RELATIONSHIP AMONG LEAKED SURFACE ACOUSTIC WAVE VELOCITY, CHEMICAL COMPOSITION RATIO AND LINEAR EXPANSION COEFFICIENT OF MATERIAL WITH STRIAE, AND METHOD OF MEASURING TiO2 CONCENTRATION IN TiO2-SiO2 GLASS AND METHOD OF MEASURING LINEAR EXPANSION COEFFICIENT USING THE RELATIONSHIP Aug 18, 2011 Mar 5, 2018 TOHOKU UNIVERSITY
46 P2009-075788 P5646147 METHOD AND DEVICE FOR MEASURING 2-D DISTRIBUTION meetings Aug 12, 2011 Mar 23, 2020 OSAKA CITY UNIVERSITY
47 P2010-502901 P5346918 (In Japanese) 局所電界分布可視化方法とその装置 Jul 25, 2011 Jan 15, 2018 Japan Science and Technology Agency
48 P2009-118868 P5429861 SCANNING REAL-TIME MICROSCOPIC SYSTEM AND SCANNING X-RAY HIGH-SPEED DRAWING SYSTEM Jul 12, 2011 Jan 25, 2018 Japan Science and Technology Agency
49 P2011-022414 P5747406 METHOD OF EVALUATING CRYSTAL PARTICLE SIZE AND PARTICLE SIZE DISTRIBUTION IN METAL LAYER AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING THE SAME meetings May 9, 2011 Jan 10, 2018 Ibaraki University
50 P2009-173619 P5339253 X-RAY STRESS MEASURING METHOD meetings achieved Jul 31, 2009 Jan 23, 2018 Kanazawa UniversityTLO(KUTLO)
51 P2006-270971 P5292568 NONDESTRUCTIVE HARDNESS EVALUATION METHOD, NONDESTRUCTIVE HARDNESS EVALUATING APPARATUS AND HARDNESS-MEASURING DEVICE USED FOR NONDESTRUCTIVE HARDNESS EVALUATION meetings Jun 13, 2008 Feb 21, 2018 Shizuoka University
52 P2006-021031 P4774544 ANGIOGRAPHY SYSTEM USING PARAMETRIC X-RAY Mar 14, 2008 Feb 15, 2018 Nihon University
53 P2006-131238 P5105342 METHOD OF HIGHLY EFFICIENTLY MEASURING PULSE NEUTRON NON-ELASTIC SCATTERING EXPERIMENT Feb 15, 2008 Feb 22, 2018 Japan Atomic Energy Agency
54 P2003-314462 P3968436 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPE AND AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY Nov 30, 2007 Mar 15, 2018 High Energy Accelerator Research Organization
55 P2004-048761 P4276106 X-RAY DIFFRACTION DEVICE AND X-RAY DIFFRACTION SYSTEM meetings Oct 26, 2007 Mar 9, 2018 Railway Technical Research Institute
56 P2003-020979 P3762993 INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPY AND INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPE Sep 14, 2007 Mar 15, 2018 Nara Institute Science and Technology
57 P2003-165776 P3637394 METHOD OF IDENTIFYING CHIRALITY OF CRYSTAL Apr 7, 2006 Mar 15, 2018 Kyoto University

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