Search of Japanese Patents
* Published Japanese patents only
Hits 10 results
| No. | Application number ▲▼ |
Gazette No ▲▼ |
Title ▲▼ |
Release Date ▲▼ |
Update Date ▲▼ |
Information Provider ▲▼ |
|---|---|---|---|---|---|---|
| 1 | P2019-026262 | P2020-134259A | (In Japanese) アクティブロードプル測定システム | Sep 25, 2020 | Oct 26, 2020 | Ryukoku University |
| 2 | P2017-066163 | P2018-170853A | PHOTOVOLTAIC MODULE EVALUATION METHOD, EVALUATION DEVICE, AND EVALUATION PROGRAM | Nov 22, 2018 | Jan 14, 2020 | Nara Institute Science and Technology |
| 3 | P2015-030900 | P6465348 | METHOD AND DEVICE FOR DETECTING CURRENT MAGNETIC FIELD DISTRIBUTION AMONG BONDING WIRES OF POWER SEMICONDUCTOR DEVICE | Oct 5, 2016 | Feb 22, 2019 | Kyushu Institute of Technology |
| 4 | P2015-030901 | P6465349 | METHOD AND DEVICE FOR INSPECTING AND DIAGNOSING CURRENT MAGNETIC FIELD DISTRIBUTION AMONG BONDING WIRES OF POWER SEMICONDUCTOR DEVICE | Oct 5, 2016 | Feb 22, 2019 | Kyushu Institute of Technology |
| 5 | P2013-537501 | P6008332 | (In Japanese) プローブカード及びノイズ測定装置 | Jun 15, 2015 | Dec 19, 2017 | University of Tsukuba |
| 6 | P2014-064326 | P6312081 |
DEFECT DIAGNOSIS DEVICE
|
Oct 8, 2014 | May 22, 2018 | Tokyo University of Science |
| 7 | P2013-033614 | P6176939 |
ABNORMAL CONDITION DETECTION METHOD FOR SOLAR BATTERY AND DEVICE THEREFOR, AND PHOTOVOLTAIC POWER GENERATION SYSTEM WITH THE DEVICE
|
Apr 3, 2013 | Dec 14, 2017 | Kanagawa Institute of Technology |
| 8 | P2011-065061 | P5854377 |
MOS TRANSISTOR INTEGRATED CIRCUIT AND SIMULATING CALCULATION SYSTEM OF DEGRADATION DEGREE OF MOS TRANSISTOR
|
Nov 1, 2012 | Nov 25, 2020 | Tokyo Metropolitan University |
| 9 | P2001-140289 | P4117700 | STEEP WAVE VOLTAGE GENERATING DEVICE | Apr 23, 2010 | Mar 20, 2018 | Japan Defense Agency |
| 10 | P2005-303364 | P5167527 | INSTRUMENT FOR MEASURING ELECTRIC CHARACTERISTICS | Aug 31, 2007 | Feb 27, 2018 | Tokyo University of Agriculture and Technology |
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