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* Published Japanese patents only

Hits 32 results

No. Application number
▲▼		 Gazette No
▲▼		 Title
▲▼		 Release Date
▲▼		 Update Date
▲▼		 Information Provider
▲▼
1 P2019-517552 WO2018207613 (In Japanese) 撮像システム、及び撮像方法 NEW_EN meetings foreign Aug 11, 2020 Aug 11, 2020 Tokyo Institute of Technology
2 P2019-511287 WO2018186448 (In Japanese) 多波長光照射装置 NEW_EN meetings Aug 5, 2020 Aug 5, 2020 Toyohashi University of Technology(TCI)
3 P2017-111416 P2018-205156A DIELECTRIC SPECTROSCOPIC DEVICE Apr 14, 2020 May 21, 2020 Kyoto University
4 P2017-222322 P2019-095220A SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYSIS METHOD achieved foreign Apr 9, 2020 May 21, 2020 Kyoto University
5 P2019-110453 P2019-220176A IMAGE PROCESSING DEVICE AND METHOD Feb 25, 2020 May 26, 2020 National Institute of Informatics
6 P2018-142832 P2020-020606A SPECTROMETER AND SPECTRAL MEASUREMENT UNIT Feb 25, 2020 Jul 1, 2020 Kagawa University
7 P2018-112764 P2019-215262A SPECTROMETRIC MEASUREMENT DEVICE AND SPECTROMETRIC MEASUREMENT METHOD Feb 25, 2020 May 26, 2020 Kagawa University
8 P2017-565879 P6321895 (In Japanese) スペクトルカメラ制御装置、スペクトルカメラ制御プログラム、スペクトルカメラ制御システム、このシステムを搭載した飛行体およびスペクトル画像撮像方法 Jan 24, 2019 Jan 24, 2019 Hokkaido University
9 P2018-107401 P2019-211326A PHOTONIC CRYSTAL ELEMENT, SPECTRAL SYSTEM HAVING THE SAME, DETECTION KIT AND DETECTION SYSTEM FOR DETECTION TARGET MATERIAL, AND METHOD FOR MANUFACTURING PHOTONIC CRYSTAL ELEMENT meetings Dec 19, 2018 May 27, 2020 Osaka Prefecture University
10 P2017-527514 WO2017007024 (In Japanese) 分光測定装置 May 23, 2018 Dec 25, 2019 Kagawa University
11 P2016-571942 P6660634 (In Japanese) 分光測定装置および分光測定方法 Dec 21, 2017 Mar 18, 2020 Techno Network Shikoku co.,ltd.
12 P2016-040357 P2017-156245A SPECTROSCOPIC APPARATUS Oct 4, 2017 Dec 25, 2019 Kagawa University
13 P2015-500127 P6281983 (In Japanese) 赤外光スペクトル計測装置及び方法 Jun 26, 2017 Mar 13, 2018 National Institutes of Natural Sciences (NINS)
14 P2015-083763 P2016-205839A IMAGE ANALYZER AND INSPECTION SYSTEM meetings foreign Dec 28, 2016 Mar 18, 2020 Hiroshima Prefectural Technology Research Institute
15 P2014-539680 P5765693 (In Japanese) 分光特性測定装置 Nov 2, 2016 Dec 15, 2017 Kagawa University
16 P2014-539798 P5881051 (In Japanese) 分光特性測定装置 Nov 2, 2016 Dec 15, 2017 Kagawa University
17 P2013-106952 P6200690 METHOD FOR CLASSIFYING MEAT COLOR meetings Jan 20, 2016 Dec 15, 2017 Obihiro University of Agriculture and Veterinary Medicine
18 P2013-002493 P6025101 EFFICIENT UTILIZATION METHOD FOR ILLUMINATION LIGHT BY COLOR CHANGE BASED ON CONTROL OF SPECTRAL DISTRIBUTION CHARACTERISTICS OF ILLUMINATION AND SPECTRAL REFLECTION CHARACTERISTICS OF COLOR MATERIAL, AND ILLUMINATION SYSTEM UTILIZING THE SAME Jul 29, 2015 Dec 20, 2017 Doshisha University
19 P2015-015735 P6482886 SPECTRAL CHARACTERISTIC MEASURING APPARATUS AND ADJUSTMENT METHOD THEREOF Feb 17, 2015 Apr 22, 2019 Kagawa University
20 P2015-015733 P6385288 SPECTRAL CHARACTERISTIC MEASURING DEVICE Feb 17, 2015 Sep 20, 2018 Kagawa University
21 P2012-034442 P6025013 WAVEFORM RECONSTRUCTION DEVICE, WAVEFORM RECONSTRUCTION SYSTEM, AND WAVEFORM RECONSTRUCTION METHOD Sep 27, 2013 Jan 16, 2018 Osaka University
22 P2005-251718 P4719879 SUM CYCLE GENERATION SPECTROSCOPE AND SUM CYCLE GENERATION SPECTROSCOPY Nov 1, 2012 Feb 26, 2018 HIROSHIMA UNIVERSITY
23 P2007-084832 P4654446 WAVELENGTH SPECTRUM DETECTION METHOD USING AVALANCHE PHOTODIODE Nov 15, 2011 Feb 9, 2018 NAGANO NATIONAL COLLEGE of TECHNOLOGY
24 P2007-523340 P4714882 (In Japanese) ブラッググレーティングの構造の同定方法および装置ならびにその作成方法 foreign Sep 13, 2011 Jan 6, 2020 University of Yamanashi
25 P2011-043171 P5648961 SPECTRAL CHARACTERISTIC MEASURING APPARATUS AND CALIBRATION METHOD THEREOF Sep 2, 2011 Dec 28, 2017 Kagawa University
26 P2006-352905 P4961555 POSITION SPECIFICATION METHOD AND APPARATUS FOR PLANT TARGET PART, AND WORKING ROBOT USING THE SAME APPARATUS Aug 18, 2011 Feb 22, 2018 UTSUNOMIYA UNIVERSITY
27 P2004-232541 P4403272 METHOD OF SPECTROMETRY AND SPECTROMETER Aug 18, 2011 Mar 7, 2018 Okayama University
28 P2003-143476 P3940376 SPECTROMETRIC DEVICE FOR GEL-LIKE SAMPLE Jun 17, 2011 Mar 16, 2018 Japan Science and Technology Agency
29 P2008-076557 P5170748 DEVICE AND METHOD FOR MEASURING SPECTRUM PHASE OF DISCRETE SPECTRUM meetings Apr 26, 2011 Feb 5, 2018 The University of Electro-Communications
30 P2005-317352 P5109112 POLARIZATION ANALYSIS SYSTEM USING POLARIZING DIFFRACTION ELEMENT AND DISPENSING WITH REQUIREMENT FOR MECHANICAL DRIVE meetings May 25, 2007 Feb 28, 2018 Nagaoka University of Technology
31 P2005-059503 P4701385 OPTICAL CHARACTERISTIC MEASURING APPARATUS, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, AND PROGRAM AND STORAGE MEDIUM USED FOR IT Sep 22, 2006 Mar 5, 2018 Hokkaido University
32 P2002-012232 P3613578 LIQUID CRYSTAL OPTICAL MEASURING INSTRUMENT AND OPTICAL MEASURING SYSTEM USING THE SAME Mar 18, 2005 Mar 20, 2018 Japan Aerospace Exploration Agency

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