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* Published Japanese patents only


Hits 14 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2019-526683 WO2019003715 (In Japanese) 流体の計測方法、計測装置および計測システム Aug 4, 2020 Aug 4, 2020 Tokai University
2 P2017-066163 P2018-170853A PHOTOVOLTAIC MODULE EVALUATION METHOD, EVALUATION DEVICE, AND EVALUATION PROGRAM Nov 22, 2018 Jan 14, 2020 Nara Institute Science and Technology
3 P2018-093884 P2019-200089A GRAIN QUALITY EVALUATION DEVICE AND GRAIN QUALITY EVALUATION METHOD Jul 13, 2018 Mar 23, 2020 Shinshu University
4 P2017-170670 P2019-045398A DEFECT DETECTION METHOD USING SPECKLE IMAGE AND DEVICE THEREFOR Jun 13, 2018 Jan 15, 2020 University of Fukui
5 P2015-208902 P2017-083523A PHOTOGRAPHING DEVICE, PHOTOGRAPHING METHOD, AND MEAT QUALITY EVALUATION METHOD FOR CARCASS meetings Jun 14, 2017 Dec 23, 2019 Obihiro University of Agriculture and Veterinary Medicine
6 P2015-083763 P6754114 IMAGE ANALYZER AND INSPECTION SYSTEM UPDATE_EN meetings foreign Dec 28, 2016 Sep 23, 2020 Hiroshima Prefectural Technology Research Institute
7 P2015-038571 P6420180 DEVICE AND METHOD FOR SURFACE INSPECTION Apr 24, 2015 Nov 20, 2018 Gifu University
8 P2012-164424 P6031724 EUROPIUM DIKETONE CHELATE COMPOUND, AND FLUORESCENCE PENETRANT TESTING METHOD OF INORGANIC MATERIAL OR METAL MATERIAL Feb 16, 2015 Dec 27, 2017 Kyushu Institute of Technology
9 P2006-073755 P4810659 APPEARANCE INSPECTION APPARATUS, APPEARANCE INSPECTION METHOD, AND APPEARANCE INSPECTION PROGRAM AND INFORMATION RECORDING MEDIUM RECORDED WITH THE SAME Aug 18, 2011 May 23, 2019 UTSUNOMIYA UNIVERSITY
10 P2007-081132 P4967132 METHOD FOR INSPECTING DEFECT IN SURFACE OF OBJECT meetings Nov 20, 2009 Feb 19, 2018 Kyushu Institute of Technology
11 P2009-106852 P5557368 SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD Aug 7, 2009 Jan 25, 2018 Tokyo Denki University
12 P2006-067553 P4910128 METHOD FOR INSPECTING DEFECT OF OBJECT SURFACE meetings Dec 5, 2008 May 23, 2019 Kyushu Institute of Technology
13 P2006-334101 P4967125 DEVICE AND METHOD FOR INSPECTING MEMBER SURFACE meetings Jul 4, 2008 Feb 15, 2018 HIROSHIMA UNIVERSITY
14 P2006-254418 P4992081 METHOD OF INSPECTING SURFACE STATE OF OBJECT BY IMAGE PROCESSING, AND IMAGE PROCESSING PROGRAM FOR IT meetings Apr 4, 2008 Feb 22, 2018 Yamaguchi TLO

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