Top > Search of Japanese Patents

Search of Japanese Patents

Display results per page Option
Patent state
Information provider
Applicant
IPC
F-term
Specify icons
Select data
カレンダー表示 カレンダー表示
Specify number
Display option Order by

Clear


* Published Japanese patents only


Hits 11 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2017-020876 P2018-128328A GEOMETRICAL ERROR MEASURING METHOD OF MACHINE TOOL May 8, 2020 May 8, 2020 Kyoto University
2 P2018-105077 P2019-209399A MAIN SPINDLE SYSTEM OF MACHINE TOOL Feb 25, 2020 May 27, 2020 KAGOSHIMA UNIVERSITY
3 P2016-084340 P6721174 DIAGNOSTIC METHOD FOR SYNCHRONIZATION ACCURACY OF ROTATING BIAXIAL MOTION UPDATE_EN Nov 29, 2018 Jul 21, 2020 Doshisha University
4 P2018-057313 P2019-169007A MACHINING MEASUREMENT DEVICE FOR MACHINING OBJECT meetings Oct 30, 2018 Jan 28, 2020 Kyushu Institute of Technology
5 P2011-222764 P5757526 METHOD OF DIAGNOSING SYNCHRONIZATION ACCURACY OF ROTARY BIAXIAL MOTION Jul 19, 2013 Dec 27, 2017 Doshisha University
6 P2010-256533 P5751611 MACHINE TOOL, AND METHOD AND PROGRAM FOR DETERMINING NUMBER AND ARRANGEMENT OF TEMPERATURE MEASUREMENT PARTS OF MACHINE TOOL meetings May 21, 2012 Jan 18, 2018 Tottori University
7 P2010-170670 P5614633 MEASURING METHOD AND SYSTEM FOR CLEARANCE LENGTH BETWEEN ROTARY TOOL AND WORKPIECE achieved foreign Feb 21, 2012 Jan 18, 2018 Kyushu Institute of Technology
8 P2006-535212 P4882069 (In Japanese) ワークの表面状態検出方法及び表面状態検出装置 meetings foreign Aug 18, 2011 Feb 21, 2018 Okayama University
9 P2002-259323 P4302380 APPARATUS AND METHOD FOR DEEP HOLE DRILLING, APPARATUS AND METHOD FOR EVALUATING DEEP HOLE AND METHOD FOR EVALUATING POSITIONING ERROR, AND APPARATUS AND METHOD FOR ADJUSTING OPTICAL AXIS OF APPARATUS FOR DEEP HOLE DRILLING AND APPARATUS FOR EVALUATING DEEP HOLE Jun 15, 2011 Mar 19, 2018 Japan Science and Technology Agency
10 P2000-380662 P3385473 MEASURING METHOD AND DEVICE OF TOOL EDGE TEMPERATURE IN CUTTING CUTTING WORKPIECE Aug 8, 2007 Apr 6, 2012 Shimane University
11 P2003-043204 P3716310 SHAPE MEASURING SYSTEM OF OBJECT TO BE EXAMINED AND SHAPE MEASURING METHOD FOR THE OBJECT TO BE EXAMINED Jan 18, 2005 Mar 14, 2018 Gifu University

(1/1 page)

  • 1

PAGE TOP