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* Published Japanese patents only


Hits 9 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2017-036566 P2018-142471A MARKING METHOD, MARKING DEVICE, AND MARKED ARTICLE meetings Nov 1, 2018 Feb 20, 2020 Gunma University
2 P2010-227866 P5585959 MOUNT DEVICE Oct 2, 2018 Oct 31, 2018 RIKEN
3 P2016-089094 P6664133 STANDARD SAMPLE WITH INCLINED SUPPORT TABLE, METHOD FOR EVALUATING SCAN TYPE ELECTRON ELECTROSCOPE AND METHOD OF EVALUATING SIC SUBSTRATE foreign Jan 24, 2018 Mar 18, 2020 Kwansei Gakuin University
4 P2016-069228 P6721899 EMBEDDING METHOD FOR ELECTRON MICROSCOPE USING MONOMER FOR HIGHLY HYDROPHILIC POLYMER AS MAIN AGENT Dec 7, 2017 Aug 24, 2020 Oita University
5 P2015-559988 P6452630 (In Japanese) 含水状態の生物試料の電子顕微鏡観察用保護剤、電子顕微鏡観察用キット、電子顕微鏡による観察、診断、評価、定量の方法並びに試料台 meetings Jun 23, 2017 Feb 22, 2019 Japan Science and Technology Agency
6 P2015-036074 P6525189 STANDARD SAMPLE FOR CALIBRATING OBSERVATION CONTRAST IN SCANNING ELECTRON MICROSCOPE, AND METHOD OF INSPECTING CRYSTALLINE SUBSTRATE USING SCANNING ELECTRON MICROSCOPE Apr 19, 2016 Jun 20, 2019 Kwansei Gakuin University
7 P2013-532684 P6055766 (In Japanese) 生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡 meetings Jun 22, 2015 Apr 18, 2018 Japan Science and Technology Agency
8 P2010-217084 P5442572 CHARGED PARTICLE BEAM DEVICE, THIN FILM FORMING METHOD, DEFECT CORRECTING METHOD, AND DEVICE MANUFACTURING METHOD Apr 17, 2012 Jan 16, 2018 Japan Science and Technology Agency
9 P2008-226466 P5437612 SAMPLE HOLDER FOR ELECTRON MICROSCOPE Apr 16, 2010 Feb 6, 2018 Japan Science and Technology Agency

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