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* Published Japanese patents only


Hits 14 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2018-508074 WO2017170554 (In Japanese) 位相差走査透過電子顕微鏡装置 May 24, 2019 May 24, 2019 National Institutes of Natural Sciences (NINS)
2 P2015-251027 P2017-117612A BIPRISM DEVICE, AND CHARGED PARTICLE BEAM DEVICE Oct 2, 2018 Oct 31, 2018 RIKEN
3 P2010-227866 P5585959 MOUNT DEVICE Oct 2, 2018 Oct 31, 2018 RIKEN
4 P2017-528715 WO2017010529 (In Japanese) 静電レンズ、並びに、該レンズとコリメータを用いた平行ビーム発生装置及び平行ビーム収束装置 meetings May 24, 2018 May 24, 2018 Nara Institute Science and Technology
5 P2017-515399 P6351196 (In Japanese) 荷電粒子ビーム用電磁レンズの球面収差補正装置 commons May 23, 2018 Jul 19, 2018 Nagoya University
6 P2016-089094 P2017-199540A STANDARD SAMPLE WITH INCLINED SUPPORT TABLE, METHOD FOR EVALUATING SCAN TYPE ELECTRON ELECTROSCOPE AND METHOD OF EVALUATING SIC SUBSTRATE foreign Jan 24, 2018 Feb 26, 2018 Kwansei Gakuin University
7 P2012-508141 P5626694 (In Japanese) 電子顕微鏡 Mar 10, 2016 Dec 21, 2017 Japan Science and Technology Agency
8 P2013-532684 P6055766 (In Japanese) 生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡 meetings Jun 22, 2015 Apr 18, 2018 Japan Science and Technology Agency
9 P2012-063526 P5975462 ABLATION APPARATUS AND THREE-DIMENSIONAL ELECTRON MICROSCOPE Oct 17, 2013 Dec 25, 2017 Kyushu University
10 P2010-134729 P5688632 OBJECTIVE LENS SYSTEM AND ELECTRON MICROSCOPE Oct 26, 2012 Jan 17, 2018 National Institutes of Natural Sciences (NINS)
11 P2009-073929 P5527680 SPIN POLARIZED ELECTRON GENERATING ELEMENT meetings Feb 14, 2012 Jan 25, 2018 Japan Science and Technology Agency
12 P2006-513733 P4852758 (In Japanese) 電子顕微方法およびそれを用いた電子顕微鏡 Feb 19, 2010 Feb 22, 2018 Hokkaido University
13 P2000-130224 P3383842 SCATTERING TARGET HOLDING MECHANISM AND ELECTRON SPIN ANALYZER May 27, 2003 Apr 5, 2012 Hokkaido University
14 P2000-133700 P3757263 ELECTRON SPIN ANALYZER May 27, 2003 Apr 22, 2013 Hokkaido University

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