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* Published Japanese patents only


Hits 7 results

No. Application number
Gazette No
Title
Release Date
Update Date
Information Provider
1 P2003-020979 P3762993 INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPY AND INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPE Sep 14, 2007 Mar 15, 2018 Nara Institute Science and Technology
2 P2005-040478 P4825966 COARSE/FINE POSITIONING DEVICE meetings Nov 17, 2006 Mar 2, 2018 UTSUNOMIYA UNIVERSITY
3 P2000-372814 P3551308 CURRENT-MEASURING METHOD AND SURFACE MEASURING APPARATUS Jan 18, 2005 Apr 6, 2012 Shizuoka University
4 P2001-064937 P3551315 METHOD FOR MEASURING CURRENT AND DEVICE FOR MEASURING SURFACE SHAPE Jan 18, 2005 Mar 20, 2018 Shizuoka University
5 P2001-192149 P3557459 SCANNING PROBE MICROSCOPE Aug 28, 2003 Mar 20, 2018 Hokkaido University
6 P2001-059440 P3472828 SCANNING MAGNETIC DETECTOR, AND PROBE FOR SCANNING MAGNETIC DETECTOR Aug 28, 2003 Mar 20, 2018 Hokkaido University
7 P2001-058528 P3527947 PROBE, ITS MANUFACTURING METHOD, AND MICROSCOPE AND TESTER HAVING PROBE Aug 28, 2003 Mar 20, 2018 Hokkaido University

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