Search of Japanese Patents
* Published Japanese patents only
Hits 7 results
| No. | Application number ▲▼ |
Gazette No ▲▼ |
Title ▲▼ |
Release Date ▲▼ |
Update Date ▲▼ |
Information Provider ▲▼ |
|---|---|---|---|---|---|---|
| 1 | P2005-040478 | P4825966 |
COARSE/FINE POSITIONING DEVICE
|
Nov 17, 2006 | Mar 2, 2018 | UTSUNOMIYA UNIVERSITY |
| 2 | P2003-020979 | P3762993 | INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPY AND INTERATOMIC TRANSITION ENERGY ANALYSIS SCANNING PROBE MICROSCOPE | Sep 14, 2007 | Mar 15, 2018 | Nara Institute Science and Technology |
| 3 | P2001-192149 | P3557459 | SCANNING PROBE MICROSCOPE | Aug 28, 2003 | Mar 20, 2018 | Hokkaido University |
| 4 | P2001-064937 | P3551315 | METHOD FOR MEASURING CURRENT AND DEVICE FOR MEASURING SURFACE SHAPE | Jan 18, 2005 | Mar 20, 2018 | Shizuoka University |
| 5 | P2000-372814 | P3551308 | CURRENT-MEASURING METHOD AND SURFACE MEASURING APPARATUS | Jan 18, 2005 | Apr 6, 2012 | Shizuoka University |
| 6 | P2001-058528 | P3527947 | PROBE, ITS MANUFACTURING METHOD, AND MICROSCOPE AND TESTER HAVING PROBE | Aug 28, 2003 | Mar 20, 2018 | Hokkaido University |
| 7 | P2001-059440 | P3472828 | SCANNING MAGNETIC DETECTOR, AND PROBE FOR SCANNING MAGNETIC DETECTOR | Aug 28, 2003 | Mar 20, 2018 | Hokkaido University |
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