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No. Technology seeds code
Name of technology
Release Date
Update Date
1 S032000006 (In Japanese) 異方性解析方法及び異方性解析装置 Oct 1, 2003 Sep 11, 2003
2 S040000035 (In Japanese) 光学変調素子用液晶材料 Aug 18, 2006 Feb 24, 2005
3 S040000365 (In Japanese) 表面プラズモンポラリトンを利用して光を波長以下の微小領域に閉じ込めながら,光を低損失伝搬可能な微小サイズの導波構造の発明 Sep 1, 2006 Mar 17, 2005
4 S040000390 (In Japanese) Hilbert変換を用いた電子的スペックル干渉法による変形計測法 Sep 1, 2006 Mar 17, 2005
5 S040000432 (In Japanese) 大きな二光子吸収特性を示すビスアセチレン結合により連結されたビス(イミダゾリルポルフィリン金属錯体)を構成単位とするポルフィリン連鎖体及びその製造方法 Sep 1, 2006 Mar 17, 2005
6 S080000106 (In Japanese) メタリック塗装などのクリア層厚みの非接触精密測定法 meetings Sep 5, 2008 Aug 25, 2008
7 S090000172 (In Japanese) 液晶レンズ Sep 14, 2009 Sep 11, 2009
8 S090000195 (In Japanese) 2次元フォトニック結晶面発光レーザ Sep 14, 2009 Sep 11, 2009
9 S090000318 (In Japanese) レーザー増幅装置 Sep 14, 2009 Sep 11, 2009
10 S090000421 (In Japanese) 液晶光学素子 Sep 14, 2009 Sep 11, 2009
11 S090000628 (In Japanese) デジタルホログラフィ装置及びデジタルホログラフィを用いた像再生方法 Sep 14, 2009 Sep 11, 2009
12 S090000778 (In Japanese) ゼロ面アンカリング液晶配向法及びその液晶デバイス Sep 14, 2009 Sep 11, 2009
13 S090000974 (In Japanese) 赤外光検出器 Sep 14, 2009 Sep 11, 2009
14 S090001381 (In Japanese) 高周波加速空胴 Mar 5, 2010 Mar 1, 2010
15 S090001383 (In Japanese) レーザー制御型電子ビーム線形加速装置 Mar 5, 2010 Mar 1, 2010
16 S090001877 (In Japanese) 光学変調素子用液晶材料 Mar 19, 2010 Mar 18, 2010
17 S090001979 (In Japanese) 荷電粒子検出方法、これを用いる荷電粒子制御方法 Mar 19, 2010 Mar 18, 2010
18 S090001985 (In Japanese) 部材表面検査装置及び部材表面検査方法 Mar 19, 2010 Mar 18, 2010
19 S090002001 (In Japanese) 光ファイバを利用した放射線及び中性子検出器 Mar 19, 2010 Mar 18, 2010
20 S090002084 (In Japanese) 自然超格子ホモロガス単結晶薄膜の製造方法。 Mar 19, 2010 Mar 18, 2010
21 S090002355 (In Japanese) コールドスプレー質量分析装置 Mar 19, 2010 Mar 18, 2010
22 S090002391 (In Japanese) 荷電粒子線照射装置 Mar 19, 2010 Mar 18, 2010
23 S090002392 (In Japanese) 高周波加速空洞及び装置 Mar 19, 2010 Mar 18, 2010
24 S090002554 (In Japanese) エバネッセントカテーテルシステム Mar 26, 2010 Mar 24, 2010
25 S090002902 (In Japanese) 放射線検出器用圧力容器システム meetings Mar 26, 2010 Mar 24, 2010
26 S090002905 (In Japanese) 側方散乱光を用いた遠隔レーザーレーダー微粒子計数装置 Mar 26, 2010 Mar 24, 2010
27 S090002917 (In Japanese) ZnS蛍光体を用いた粒子線検出器及び中性子検出器 meetings Mar 26, 2010 Mar 24, 2010
28 S090002924 (In Japanese) 高感度ガス分析装置 meetings Mar 26, 2010 Mar 24, 2010
29 S090002965 (In Japanese) パルス中性子非弾性散乱実験の高効率測定方法 Mar 26, 2010 Mar 24, 2010
30 S090002977 (In Japanese) ZnS蛍光体を用いたシンチレーション中性子検出器の中性子/ガンマ線弁別方法 Mar 26, 2010 Mar 24, 2010
31 S090003361 (In Japanese) パルス波高整列放射線位置検出器 Mar 26, 2010 Mar 24, 2010
32 S090003371 (In Japanese) 中性子線量当量測定器 Mar 26, 2010 Mar 24, 2010
33 S090003374 (In Japanese) 深さ位置認識型放射線検出器 Mar 26, 2010 Mar 24, 2010
34 S090003375 (In Japanese) 放射線位置検出器の校正方法 Mar 26, 2010 Mar 24, 2010
35 S090003379 (In Japanese) 放射線方向性検出器及び放射線モニタリング方法、装置 Mar 26, 2010 Mar 24, 2010
36 S090003411 (In Japanese) 連続移動物体のリアルタイム形状計測方法及びシステム Mar 26, 2010 Mar 24, 2010
37 S090003412 (In Japanese) 縞位相解析方法 Mar 26, 2010 Mar 24, 2010
38 S090003413 (In Japanese) 単色矩形波格子を用いる形状計測方法及び形状計測装置 Mar 26, 2010 Mar 24, 2010
39 S090003548 (In Japanese) 蛍光測定装置 Mar 30, 2010 Mar 26, 2010
40 S090003549 (In Japanese) 屈折率センサー、屈折率測定装置及び屈折率センサーの製造方法 meetings Mar 30, 2010 Mar 26, 2010
41 S090003583 (In Japanese) 光導波装置 Mar 30, 2010 Mar 26, 2010
42 S090003589 (In Japanese) 生物演出システム Mar 30, 2010 Mar 26, 2010
43 S090003600 (In Japanese) 高密度光くし型フィルタ及びその作製方法 Mar 30, 2010 Mar 26, 2010
44 S090003652 (In Japanese) 注釈表示装置およびこれを用いた注釈表示システム Mar 30, 2010 Mar 26, 2010
45 S090003704 (In Japanese) 所望の波形をもつ光パルス信号または電気パルス信号を生成する方法および装置 Mar 30, 2010 Mar 26, 2010
46 S090003740 (In Japanese) レーザー照射微細加工方法及び該方法を用いて構成された半導体ウェーハ Mar 30, 2010 Mar 26, 2010
47 S090004143 (In Japanese) 粒子集積構造体の製造方法 Mar 30, 2010 Mar 26, 2010
48 S090004352 (In Japanese) もつれ合い光子対発生装置 Mar 30, 2010 Mar 26, 2010
49 S090004353 (In Japanese) ピコ秒レーザーによるホログラムの製造方法 Mar 30, 2010 Mar 26, 2010
50 S090004437 (In Japanese) イオン源 Mar 30, 2010 Mar 26, 2010
51 S100001704 FORMING METHOD OF FINE PATTERN, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Oct 4, 2010 Oct 4, 2010
52 S100001749 METHOD AND APPARATUS FOR MEASURING LEVEL IN FORBIDDEN BAND BY PHOTOLUMINESCENCE WITH ADDED THERMAL EXCITATION Oct 4, 2010 Oct 4, 2010
53 S100001795 METHOD OF MANUFACTURING FINE FACET SHAPE ON SURFACE OF SEMICONDUCTOR SUBSTRATE Oct 4, 2010 Oct 4, 2010
54 S100001813 INTERFACE FOR MASS SPECTROMETRIC ANALYSIS, MASS SPECTROMETER, AND MASS SPECTROMETRY Oct 4, 2010 Oct 4, 2010
55 S100001817 METHOD AND APPARATUS FOR ANISOTROPIC ANALYSIS Oct 4, 2010 Oct 4, 2010
56 S100001875 OPTICAL MEDIUM FOR LASER, LASER, AND METHOD FOR MANUFACTURING OPTICAL MEDIUM FOR THE LASER Oct 6, 2010 Oct 6, 2010
57 S100001912 THERMO-OPTICAL CONSTANT MEASURING METHOD FOR POLYMERIC MATERIAL AND THERMO-OPTICAL CONSTANT MEASURING METHOD FOR POLYMERIC THIN FILM Oct 6, 2010 Oct 6, 2010
58 S100001916 LARGE-AREA NEGATIVE ION SOURCE Oct 6, 2010 Oct 6, 2010
59 S100001930 SCANNING MAGNETIC DETECTOR, AND PROBE FOR SCANNING MAGNETIC DETECTOR Oct 6, 2010 Oct 6, 2010
60 S100001933 SCANNING PROBE MICROSCOPE Oct 6, 2010 Oct 6, 2010
61 S100002085 LIQUID CRYSTAL OPTICAL MEASURING INSTRUMENT AND OPTICAL MEASURING SYSTEM USING THE SAME Oct 7, 2010 Oct 7, 2010
62 S100002103 COMPOUND TRANSMISSION CABLE CONNECTING APPARATUS FOR REMOTE SENSING MACHINE AND OTHERS Oct 7, 2010 Oct 7, 2010
63 S100002107 OPTICAL FIBER MAGNETIC SENSOR Oct 7, 2010 Oct 7, 2010
64 S100002117 IMAGE PROCESSING METHOD FOR TARGET EXTRACTION FROM INFRARED IMAGE, TARGET EXTRACTION METHOD, GROUND OBSERVATION METHOD FOR TRACING EXTRACTED TARGET, GUIDANCE METHOD FOR MISSILE AND DEVICE OF THEM Oct 7, 2010 Oct 7, 2010
65 S100002122 ANGLE-MEASUREMENT-ACCURACY MEASURING APPARATUS Oct 7, 2010 Oct 7, 2010
66 S100002127 METHOD FOR FORMING SILICON OXIDE FILM BY LIGHT IRRADIATION OF COMPOUND CONTAINING Si-O-Si BOND Oct 7, 2010 Oct 7, 2010
67 S100002128 REMOTE SENSING APPARATUS AND FREQUENCY ANALYSIS METHOD OF THE SAME Oct 7, 2010 Oct 7, 2010
68 S100002200 HEMANALYSIS METHOD AND DEVICE USING NEAR-INFRARED SPECTROSCOPIC METHOD Oct 7, 2010 Oct 7, 2010
69 S100002201 LIQUID SAMPLE ANALYZING METHOD AND DEVICE USING NEAR- INFRARED SPECTROSCOPIC METHOD Oct 7, 2010 Oct 7, 2010
70 S100002681 METHOD FOR CONTROLLING REFRACTIVE INDEX OF OPTICAL FILM USING LASER ABLATION AND METHOD FOR FORMING OPTICAL ELEMENT Nov 5, 2010 Nov 5, 2010
71 S100002685 SURFACE MODIFYING METHOD OF SOLID COMPOUND HAVING Si-O-Si BOND BY USING LASER BEAM Nov 5, 2010 Nov 5, 2010
72 S100002686 THERMAL INFRARED DETECTOR HAVING SMALL THERMAL TIME CONSTANT, AND MANUFACTURING METHOD THEREFOR Nov 5, 2010 Nov 5, 2010
73 S100002697 OPTICAL DIFFRACTION GRATING ELEMENT AND ITS MANUFACTURING METHOD Nov 5, 2010 Nov 5, 2010
74 S100002733 OPTICAL CHARACTERISTIC MEASURING APPARATUS, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, AND PROGRAM AND STORAGE MEDIUM USED FOR IT Nov 5, 2010 Nov 5, 2010
75 S100002826 DEFORMATION MEASUREMENT METHOD AND DEVICE USING ELECTRONIC SPECKLE INTERFEROMETRY Nov 5, 2010 Nov 5, 2010
76 S100002828 SHAPE ANALYZING METHOD USING ULTRASONIC INTERFERENCE FRINGE AND SHAPE ANALYZER THEREFOR Nov 5, 2010 Nov 5, 2010
77 S100002830 MEASURING APPARATUS AND MEASURING METHOD FOR SURFACE PLASMON Nov 5, 2010 Nov 5, 2010
78 S100002855 BARIUM TITANATE CRYSTAL, CONDENSER, OPTICAL SWITCH AND FRAM Nov 5, 2010 Nov 5, 2010
79 S100002863 ION BEAM MICROMACHINING METHOD Nov 5, 2010 Nov 5, 2010
80 S100002918 TEMPERATURE SENSOR Nov 5, 2010 Nov 5, 2010
81 S100002919 TEMPERATURE MEASURING APPARATUS, SIGNAL PROCESSOR AND SIGNAL PROCESSING PROGRAM Nov 5, 2010 Nov 5, 2010
82 S100002942 RADIATION ARRIVAL POSITION DETECTION SYSTEM Nov 5, 2010 Nov 5, 2010
83 S100002979 GOLD FINE PARTICLE ASSEMBLY AND ITS MANUFACTURING METHOD Nov 5, 2010 Nov 5, 2010
84 S100003022 METHOD AND APPARATUS FOR MEASURING LASER INTERFERENCE DISPLACEMENT Nov 5, 2010 Nov 5, 2010
85 S100003028 THREE-DIMENSIONAL MEASURING INSTRUMENT, METHOD, AND PROGRAM Nov 5, 2010 Nov 5, 2010
86 S100003122 RAMAN SPECTRUM MEASURING METHOD, NOBLE METAL PARTICLE USED FOR THE SAME, AND PRECIOUS METAL PARTICLE MANUFACTURING METHOD Nov 5, 2010 Nov 5, 2010
87 S100003170 LIGHT TIME-OF-FLIGHT TYPE RANGE SENSOR Nov 5, 2010 Nov 5, 2010
88 S100003171 TOF DISTANCE SENSOR EQUIPPED WITH OFFSET REDUCTION FUNCTION Nov 5, 2010 Nov 5, 2010
89 S100003177 DETERMINATION METHOD OF ACTIVE OXYGEN Nov 5, 2010 Nov 5, 2010
90 S100003180 SYSTEM FOR DETERMINING DIRECTION OF HIGH-ENERGY SOURCE Nov 5, 2010 Nov 5, 2010
91 S100003181 RING-LIKE SYSTEM FOR DETERMINING DIRECTION OF HIGH-ENERGY SOURCE Nov 5, 2010 Nov 5, 2010
92 S100003183 ABSOLUTE ARRANGEMENT DETERMINATION METHOD OF OPTICALLY ACTIVE MOLECULE, ABSOLUTE ARRANGEMENT DETERMINATION DEVICE AND PROGRAM Nov 5, 2010 Nov 5, 2010
93 S100003559 LIGHT-TRANSMITTING ALUMINA SINTERED COMPACT AND OPTICAL FILTER Dec 2, 2010 Dec 2, 2010
94 S100003594 POST FOR BUILDING ABUTMENT, APPARATUS AND METHOD FOR LIGHT IRRADIATION TO PHOTOCURABLE RESIN PACKED IN ROOT CANAL, APPARATUS AND METHOD FOR CURING PHOTOCURABLE RESIN PACKED IN ROOT CANAL Dec 2, 2010 Dec 2, 2010
95 S100003730 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPE AND AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY Dec 2, 2010 Dec 2, 2010
96 S100003732 BONDING STRUCTURE OF CARBON UTILIZATION ELECTRON EMISSION MATERIAL TO BASE PLATE AND ITS BONDING METHOD Dec 2, 2010 Dec 2, 2010
97 S100003762 ION CURRENT MEASURING APPARATUS Dec 3, 2010 Dec 3, 2010
98 S100003813 ELECTRON EMISSION SOURCE USING CARBON NANOTUBES AND POLYMER, AND ITS MANUFACTURING METHOD Dec 3, 2010 Dec 3, 2010
99 S100003841 DISTANCE IMAGE SENSOR Dec 3, 2010 Dec 3, 2010
100 S100003848 WIDE COLOR AREA ANIMATION CAMERA Dec 3, 2010 Dec 3, 2010

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